发表论文:
- 1. Shi S, Muralikrishnan B, Sawyer D. Terrestrial laser scanner calibration and performance evaluation using the network method[J]. Optics and Lasers in Engineering, 2020, 134: 106298.
- 2. Shi S, Muralikrishnan B, Lee V, et al. Methods to improve the dimensional measurement accuracy of a motion tracking system[J]. Optics and Lasers in Engineering, 2020, 130: 106092.
- 3. Shi S, Muralikrishnan B, Lee V, et al. Improvised long test lengths via stitching scale bar method: Performance evaluation of terrestrial laser scanners per ASTM E3125-17[J]. Journal of Research of the National Institute of Standards and Technology, 2020, 125: 1-14.
- 4. Shi S, Yang L, Lin J, et al. Omnidirectional angle constraint based dynamic six-degree-of-freedom measurement for spacecraft rendezvous and docking simulation[J]. Measurement Science and Technology, 2018, 29(4): 045005.
- 5. Shi S, Yang L, Lin J, et al. Dynamic measurement error modeling and analysis in a photoelectric scanning measurement network[J]. Applied Sciences, 2018, 9(1): 62.
- 6. Deng R, Shi S*, Yang L, et al. The generation mechanism and identification of spatially non-continuous error in integral multi-station measurement systems[J]. Measurement Science and Technology, 2023, 34(8): 085007.
- 7. Deng R, Shi S*, Yang L, et al. Dynamic measurement method based on temporal-spatial geometry constraint and optimized motion estimation[J]. Measurement, 2024, 227: 114269.
- 8. Lin J, Xin R, Shi S*, et al. An accurate 6-DOF dynamic measurement system with laser tracker for large-scale metrology[J]. Measurement, 2022, 204: 112052.
- 9. Shi S, Yang L, Lin J, et al. Analysis on the dynamic error for optoelectronic scanning coordinate measurement network[C]. 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems. SPIE, 2018, 10621: 173-181.
- 10. Zhang R, Shi S*, Lin J, et al. Calibration and measurement space inconsistency analysis for workshop Measurement Positioning System (wMPS)[C]. 2021 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems. SPIE, 2022, 12282: 171-177.
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