发表论文(第一作者或通讯作者):
- 1. Wang Yilin, Wu Enxiu, Liu Jirui, Jia Mengke, Zhang Rui*, Wu Sen*, Electrical characterization of an individual nanowire using flexible nanoprobes fabricated by atomic force microscopy-based manipulation, Nanotechnology and Precision Engineering, 2023, 6:043005
- 2. Lu Nianghang, Wang Yilin, Xiao Shasha, Zhang Rui, Xue Tao, Hu Xiaodong, Wu Sen*, A combination system of a thin atomic force microscope and an upright Raman microscope for position-controllable surface-enhanced Raman, Microscopy and Microanalysis, 2023, 29(1):180-188
- 3. Lu Nianghang, Xiao Shasha, Zhang Rui, Liu Jirui, Ma Long, Wu Sen*, Thin head atomic force microscope for integration with optical microscope, Review of Scientific Instruments, 2022, 93:083702
- 4. Bai Huitian, Wu Sen*, Deep-learning-based nanowire detection in AFM images for automated nanomanipulation, Nanotechnology and Precision Engineering, 2021, 4(1):013002 (Cover)
- 5. Bai Huitian, Wu Sen*, Nanowire detection in AFM images using deep learning, Microscopy and Microanalysis, 2020, 27(1):54-64
- 6. Zhang Rui, Wu Sen*, Xiao Sha-Sha, Hu Xiao-Dong, Shi Yu-Shu, Fu Xing, Three-dimensional atomic force microscopy based on tailored cantilever probe with flared tip, Journal of Measurement Science and Instrumentation, 2020, 11(4):388-396
- 7. Xiao Shasha, Lu Nianhang, Zhang Rui, Wu Sen*, A novel 3D traceable optical beam detection system designed for probe-scanning metrological AFM, Proc. SPIE, 11434:114341K, 2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, Beijing, P.R.China, 2019 Oct.26-28
- 8. Lu Nianhang, Xiao Shasha, Hu Xiaodong, Zhang Rui, Wu Sen*, An innovative design of AFM for easily integrated with optical microscope, Proc. SPIE, 11434:114341C, 2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, Beijing, P.R.China, 2019 Oct.26-28
- 9. Liu Lu, Wu Sen*, Wang Yanyan, Hu Xiaodong, Hu Xiaotang, Adaptive velocity-dependent proportional-integral controller for high-speed atomic force microscopy, Journal of Microscopy, 2019, 275(2):107-114
- 10. Liu Lu, Wu Sen*, Pang Hai, Hu Xiaodong, Hu Xiaotang, High-speed atomic force microscope with a combined tip-sample scanning architecture, Review of Scientific Instruments, 2019, 90:063707
- 11. Zhang Rui, Wu Sen*, Liu Lu, Fu Xing, Gao Si-Tian, Hu Xiaodong, Adaptive-angle-scanning method for three-dimensional measurement with AFM, Measurement Science and Technology, 2019, 30(9):095005
- 12. Liu Lu, Xu Jianguo, Zhang Rui, Wu Sen*, Hu Xiaodong, Hu Xiaotang, Three-dimensional atomic force microscopy for sidewall imaging using torsional resonance mode, Scanning, 2018, 2018:7606037
- 13. Zhang Rui, Wu Sen*, Liu Lu, Lu Nian-Hang, Fu Xing, Gao Si-Tian, Hu Xiao-Dong, A CD-probe with a tailored cantilever for 3D-AFM measurement, Measurement Science and Technology, 2018, 29:125011
- 14. 刘璐,吴森*,胡晓东,庞海,胡小唐,X轴分离式高速原子力显微镜系统的设计,光学精密工程,2018,26(3):662-671
- 15. Xu Linyan*, Qian Shuangbei, Xie Yuan, Wu Enxiu, Hei Haicheng, Feng Zhihong, Wu Sen*, Hu Xiaodong, Guo Tong, Zhang Daihua, The effect of air stable n-doping through mild plasma on the mechanical property of WSe2 layers, Nanotechnology, 2018, 29:175703
- 16. 李艳宁,曾荟燕,吴森*,刘璐,胡晓东,一种适用于原位纳米力学测试的AFM测头,纳米技术与精密工程,2017,15(2):93-99.
- 17. Wu Sen*, Bai Huitian, Jin Fan, Automated manipulation of flexible nanowires with an atomic force microscope, 2017, 229-235, IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), Shanghai, P.R.China, 2017 Aug.7-11 (Best conference paper)
- 18. Liu Hong-Zhi, Wu Sen*, Zhang Jun-Ming Bai Hui-Tian, Jin Fan, Pang Hai, Hu Xiao-Dong, Strategies for the AFM-based manipulation of silver nanowires on a flat surface, Nanotechnology, 2017, 28(36): 365301
- 19. 吴森*,张峻铭,刘鸿志,张锐,胡晓东,银纳米线与二氧化硅衬底表面摩擦力的测量,电子显微学报,2016,35(2):109-117
- 20. 刘璐,徐建国,吴森*,张锐,徐临燕,胡晓东,基于扭转谐振模式3D-AFM的微结构侧壁形貌检测,纳米技术与精密工程,2016,14(1):1-7
- 21. Tao Jin, Shen Wanfu, Wu Sen*, Liu Lu, Feng Zhihong, Wang Chao, Hu Chunguang, Yao Pei, Zhang Hao, Pang Wei, Duan Xuexin, Liu Jing, Zhou Chongwu, Zhang Daihua*, Mechanical and electrical anisotropy of few-layer black phosphorus, ACSNANO, 2015, 9(11):11362-11370
- 22. Song Yun-Peng, Wu Sen*, Xu Lin-Yan, Zhang Jun-Ming, Dorantes-Gonzalez Dante J, Fu Xing, Hu Xiao-Dong, Calibration of the effective spring constant of ultra-short cantilevers for high-speed atomic force microscope, Measurement Science and Technology, 2015, 26(6):065001
- 23. Song Yunpeng, Wu Sen*, Xu Linyan, Fu Xing, Calibration of the lateral spring constant of atomic force microscope cantilevers, Proc. of SPIE, 2015, 9673:96730B
- 24. 宋云鹏,吴森*,傅星,徐临燕,AFM微悬臂梁探针弹性常数各种标定方法的比较与分析,传感技术学报,2015,28(8):1161-1168
- 25. 胡晓东,万建峰,吴森*,徐临燕,李凯凯,徐建国,卢念航,工业型扫描探针显微系统中样品快速定位方法,纳米技术与精密工程,2015,13(1):8-16
- 26. 宋云鹏,吴森*,耿新宇,傅星,具有溯源性的原子力显微镜探针法向弹性常数标定系统,纳米技术与精密工程,2014,12(4):249-257
- 27. 刘璐,李艳宁,吴森*,胡晓东,基于显微光杠杆技术的微结构偏转角测量系统,光学技术,2014,40(3):219-224
- 28. Zhang Chao, Wu Sen*, Fu Xing, Automated manipulation of carbon nanotubes using atomic force microscopy, Journal of Nanoscience and Nanotechnology, 2013, 13(1):598-602
- 29. 吴森,陈庆超,张超,傅星,胡晓东*,胡小唐,基于弯曲法的AFM微悬臂梁弹性常数标定技术,仪器仪表学报,2012,33(11):2446-2453
- 30. 包汉瑜,吴森*,吴瑶瑶,微悬臂梁横向弹性系数标定技术,传感器与微系统,2012,8:60-63
- 31. Wu Sen*, Feng Jian-Min, Fu Xing, Hu Xiao-Dong, Dorantes Dante, Li Ya-Li*, Hu Xiao-Tang, Manipulation of individual double-walled carbon nanotubes packed in a casing shell, Nanotechnology, 2011, 22:285308
- 32. Wu Sen*, Fu Xing, Hu Xiaodong, Hu Xiaotang, Manipulation and behavior modeling of one-dimensional nanomaterials on a structured surface, Applied Surface Science, 2010, 256(14):4738
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