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近期学术论文：
- 1) Lin Yuan, Tong Guo*, Dawei Tang, Haitao Liu, Xinyuan Guo, Simultaneous film thickness and refractive index measurement using a constrained fitting method in white light spectral interferometer, Optics Express, 2022, 30(1): 349-363
- 2) Tianqi Gu, Zude Luo, Tong Guo, Tianzhi Luo*, A new reconstruction method for measurement data with multiple outliers, IEEE Transactions on Instrumentation & Measurement, 2022, 71: 1005709
- 3) Xinyuan Guo, Tong Guo*, Lin Yuan, Measurement of film structure using time–frequency-domain fitting and white-light scanning interferometry, Machines, 2021, 9(12): 336
- 4) Tong Guo, Xinyuan Guo, Yangyang Wei, Multi-mode interferometric measurement system based on wavelength modulation and active vibration resistance, Optics Express, 2021, 29(22): 36689-36703
- 5) Tong Guo, Guanhua Zhao, Dawei Tang, Qianwen weng, Changbin Sun, Feng Gao, Xiangqian Jiang, High-accuracy simultaneous measurement of surface profile and film thickness using line-field white-light dispersive interferometer, Optics and Lasers in Engineering, 2021, 137: 106388
- 6) Lin Yuan, Tong Guo*, Zhongjun Qiu, Xing Fu, Xiaotang Hu, An analysis of the focus variation microscope and its application in the measurement of tool parameter, International Journal of Precision Engineering and Manufacturing, 2020, 21(12): 2249-2261
- 7) Tong Guo, Guanhua Zhao, Dawei Tang, Qianwen Weng, Feng Gao, Xiangqian Jiang, Accuracy improvement of a white-light spectral interferometer using a line-by-line spectral calibration method, Surface Topography: Metrology and Properties, 2020, 8(2): 025028
- 8) Tong Guo, Lin Yuan, Dawei Tang, Zhuo Chen, Feng Gao, Xiangqian Jiang, Analysis of the synchronous phase-shifting method in a white-light spectral interferometer, Applied Optics, 2020, 59(10): 2983-2991
- 9) Lin Yuan, Tong Guo*, Zhongjun Qiu, Xing Fu, Xiaotang Hu, Measurement of geometrical parameters of cutting tool based on focus variation technology, The International Journal of Advanced Manufacturing Technology, 2019, 105(5): 2383-2391
- 10) Tong Guo, Qianwen Weng, Bei Luo, Jinping Chen, Xing Fu, Xiaotang Hu, Nonlinear phase error analysis of equivalent thickness in a white-light spectral interferometer, Nanotechnology and Precision Engineering, 2019, 2(2): 77-82
- 11) Tong Guo, Lin Yuan, Zhuo Chen, Feng Gao, Xiangqian Jiang, Rapid measurement of large step heights using a microscopic white-light spectral interferometer, Surface Topography: Metrology and Properties, 2019, 7(2): 025024
- 12) Tong Guo, Lin Yuan, Zhuo Chen, Minghui Li, Xing Fu and Xiaotang Hu, Single Point Linnik White-light Spectral Microscopic Interferometer for Surface Measurement, Surface Topography: Metrology and Properties, 2018, 6(3): 034008
- 13) Zhenyuan Song, Tong Guo*, Xing Fu, Xiaotang Hu, Residual vibration control based on a global search method in a high-speed white light scanning interferometer, Applied Optics, 2018, 57(13): 3415-3422
- 14) Tong Guo, Zhuo Chen, Minghui Li, Juhong Wu, Xing Fu, Xiaotang Hu, Film thickness measurement based on nonlinear phase analysis using a Linnik microscopic white-light spectral interferometer, Applied Optics, 2018, 57(12): 2955-2961
- 15) Tong Guo, Minghui Li, Yong Zhou, Lianfeng Ni, Xing Fu, Xiaotang Hu, Wavelength correction for thin film measurement in a microscopic white light spectral interferometer, Optik, 2017, 145: 188-201
- 16) Zhichao Wu, Tong Guo*, Ran Tao, Linyan Xu, Jinping Chen, Xing Fu, Xiaotang Hu, The model analysis of a complex tuning fork probe and its application in bimodal atomic force microscopy, Applied Sciences, 2017, 7(2): 121
- 17) Tong Guo, Juhong Wu, Lianfeng Ni, Xing Fu, Xiaotang Hu, Initial estimation of thin film thickness measurement based on white light spectral interferometry, Thin Solid Films, 2016, 612: 267-273
- 18) Tong Guo, Feng Li, Jinping Chen, Xing Fu, Xiaotang Hu, Multi-wavelength phase-shifting interferometry for micro-structures measurement based on color image processing in white light interference, Optics and Lasers in Engineering, 2016, 82: 41-47
- 19) Zhichao Wu, Tong Guo*, Ran Tao, Leihua Liu, Jinping Chen, Xing Fu, Xiaotang Hu, A Unique Self-Sensing, Self-Actuating AFM Probe at Higher Eigenmodes, Sensors, 2015, 15(11): 28764-28771
- 20) 郭彤，李峰，倪连峰，陈津平，傅星，胡小唐，基于白光干涉彩色图像测量微结构的表面形貌，光学学报，2014，34(2): 0212003
- 21) Tong Guo, Longlong Wang, Jinping Chen, Xing Fu, Xiaotang Hu, Development of a large-range atomic force microscope measuring system for optical free form surface characterization, Measurement Science and Technology, 2012, 23(11): 115401
- 22) Tong Guo, Siming Wang, Dante J. Dorantes-Gonzalez, Jinping Chen, Xing Fu, Xiaotang Hu, Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry, Sensors, 2012, 12(1): 175-188
- 23) Tong Guo, Long Ma, Jian Zhao, Dante J. Dorantes-Gonzalez, Xing Fu, Xiaotang Hu, A nanomeasuring machine based white light tilt scanning interferometer for large scale optical array structure measurement, Optics and Lasers in Engineering, 2011, 49 (9-10): 1124-1130
- 24) Tong Guo, Long Ma, Jinping Chen, Xing Fu, Xiaotang Hu, MEMS surface characterization based on white light phase shifting interferometry, Optical Engineering, 2011, 50(5): 053606
- 25) Jian Zhao, Tong Guo*, Long Ma, Xing Fu, Xiaotang Hu, Metrological atomic force microscope with self-sensing measuring head, Sensors and Actuators A : Physical, 2011, 167(2): 267-272
- 26) Zonghua Zhang, Haiyan Ma, Tong Guo, Sixiang Zhang, Jinping Chen, Simple, flexible calibration of phase calculation based three-dimensional imaging system, OPTICS LETTERS, 2011, 36(7): 1257-1259
- 27) Zhang Zonghua, Ma Haiyan, Zhang Sixiang, Guo Tong, Towers Catherine E., Towers David P., Simple calibration of a phase-based 3D imaging system based on uneven fringe projection, OPTICS LETTERS, 2011, 36(5): 627-629
- 28) Tong Guo, Hong Chang, Jinping Chen, Xing Fu, Xiaotang Hu, Micro-motion Analyzer used for Dynamic MEMS Characterization, Optics and Lasers in Engineering, 2009, 47(3-4): 512-517
- 29) Jinping Chen, Tong Guo, Xiaodong Hu, Xiaotang Hu, Analysis on vibration rejection ratio of scanning probe microscope, J. Vac. Sci. Technol. B, 2009, 27(3): 1413-1417
- 30) Li Yanning, Li Wen, Guo Tong, Yan Zhidan, Fu Xing, Hu Xiaotang, Study on structure optimization of a piezoelectric cantilever with a proof mass for vibration-powered energy harvesting system, J. Vac. Sci. Technol. B, 2009, 27(3): 1288-1290
- 31) Hu Xiaodong, Hu Chunguang, Chen Zhi, Guo Tong, Hu Xiaotang, Measuring in-plane and out-of-plane coupled motions of microstructures by stroboscopic microscopic interferometry, Optics and Laser Technology, 2007, 39(6): 1176-1182
- 32) Hu Xiaodong, Liu Gang, Hu Chunguang, Guo Tong, Hu Xiaotang, Characterization of static and dynamic microstructures by microscopic interferometry based on a Fourier transform method, Measurement Science and Technology, 2006, 17 (6): 1312-1318
- 33) Hu Xiaodong, Guo Tong, Fu Xing, Hu Xiaotang, Nanoscale oxide structures induced by dynamic electric field on Si with AFM, Applied Surface Science, 2003, 217(1-4): 34-38
专著：
- [1] 房丰洲，宫虎，张效栋，郭彤，2009，复杂曲面加工领域科学技术发展研究，机械工程学科发展报告，中国科学技术出版社。
- [2] 胡小唐，傅星，刘庆纲，李艳宁，胡晓东，郭彤，2009，微纳检测技术，天津大学出版社。
- [3] Tong Guo, Long Ma, Yan Bian, “MEMS characterization based on optical measuring methods” for book “Microelectromechanical Systems and Devices”(ISBN: 978-953-51-0306-6), Intech publisher, 2012.
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